ARKEO PRODUCT FAMILY

Two platforms, built for two different research goals.

ARKEO turns complex optoelectronic testing into a coordinated system. Choose All-in-one when you need many characterization techniques, or Multichannel when you need to test many devices in parallel.

ARKEO All-in-oneOne setup. Many techniques.ARKEO MultichannelMany devices. One workflow.

START FROM YOUR EXPERIMENT

Which ARKEO do you need?

01I need to understand a device in depth.Choose All-in-one for advanced electrical, optical and transient characterization.02I need to compare many devices over time.Choose Multichannel for parallel JV, MPPT and automated stability testing.
MULTI-TECHNIQUE PLATFORM01

ARKEO All-in-one

One research station for complete optoelectronic characterization.

All-in-one combines precision electrical measurements, fast acquisition, programmable illumination, thermal control and optical accessories inside one modular platform. Instead of operating several disconnected instruments, the entire experiment is configured, synchronized and saved through ARKEO software.

BEST FOR

Research groups developing photovoltaic, light-emitting, semiconductor and emerging optoelectronic devices that require different measurement methods on the same sample.

Open technical manual ↗
ARKEO All-in-one optoelectronic characterization platform
Modular hardwareIntegrated measurement stageUnified software
A

Why it matters

Measurements that normally require separate benches can run as one repeatable workflow, with shared settings, synchronization and data structure.

B

How it grows

Eurocard modules, accessories and programmable third-party instruments can be added without redesigning the complete system.

C

What you gain

Less time rebuilding setups, more consistent experiments and a direct path from basic JV measurements to advanced physical analysis.

FROM STEADY STATE TO FAST DYNAMICS

A complete characterization toolbox

01

Electrical characterization

Sun and dark JV, MPPT, four-point resistivity and automated parameter sweeps.

02

Transient and frequency response

TPV, TPC, Photo-CELIV, EIS, IMPS and IMVS with synchronized fast hardware.

03

Optical characterization

IPCE/EQE, photoluminescence, electroluminescence, PLQY and TRPL workflows.

04

Controlled test conditions

Temperature-controlled stage, programmable illumination and integrated accessories.

PARALLEL TESTING PLATFORM02

ARKEO Multichannel

Independent measurements for statistically stronger stability data.

Multichannel runs electrical characterization and long-duration tracking on many devices at the same time. Every channel operates independently, while the software coordinates JV scans, MPPT, fixed operating points, sensor data and environmental conditions across the complete experiment.

BEST FOR

Laboratories and development teams that need high-throughput screening, accelerated ageing, reproducibility studies and months-long device monitoring.

Open technical manual ↗
ARKEO Multichannel software showing parallel measurement channels
ARKEO large-area LED light soaker
ARKEO environmental chamber
Independent SMUsEnvironmental controlLong-term automation
A

Why it matters

Device degradation is rarely understood from a single sample. Parallel channels make comparisons and statistics part of the measurement from the beginning.

B

How it grows

Plug-in SMU boards, configurable sample holders, light sources and chambers allow the platform to expand with the laboratory workload.

C

What you gain

More devices tested per campaign, cleaner comparisons and automated data capture throughout long-duration experiments.

BUILT FOR RELIABILITY STUDIES

Parallel measurement without sacrificing control

01

Independent parallel channels

Each device is driven and measured by its own SMU channel—without multiplexing.

02

Long-term stability

Continuous MPPT, fixed-voltage or fixed-current operation with periodic JV scans.

03

Automated environments

Connect light soakers, chambers and temperature, humidity, irradiance, O₂ and CO₂ sensors.

04

Scalable operation

Expand the number of channels and let several users run independent experiments together.

SIDE-BY-SIDE

The difference at a glance

Both systems are modular and automated. The decisive difference is whether your priority is measurement depth or parallel experimental scale.

Research need
ARKEOAll-in-one
ARKEOMultichannel
Primary purpose
Deep, multi-technique characterization
Parallel testing and stability studies
Best suited to
New materials, devices and measurement methods
Device screening, ageing and reliability
Core workflows
JV, EQE, transients, impedance and luminescence
JV, MPPT, fixed setpoints and day–night cycles
Experimental scale
One highly configurable research station
Many devices measured independently in parallel
Key advantage
One platform replaces multiple disconnected setups
More statistically meaningful data in less laboratory time

ONE ARKEO ECOSYSTEM

Different roles. The same engineering principles.

Every ARKEO configuration is designed around modular hardware, coordinated software and open integration with the instruments already present in your laboratory.

01

Modular by design

Add measurement boards, controllers, probes, holders and accessories as needs evolve.

02

Automated workflows

Coordinate measurements, settings, timing, environments and long experimental sequences.

03

Structured data

Keep results, metadata and settings organized for traceability and post-processing.

04

Open integration

Connect programmable SMUs, oscilloscopes, spectrometers, sensors and laboratory systems.

CUSTOM-BUILT AROUND YOUR WORKFLOW

Not sure which platform—or which modules—you need?

Tell us what devices you measure, which routines you use and how many samples must run in parallel. We will define the most suitable ARKEO configuration with you.

Discuss your system